- Inertial Sensor Test Handler System
High-precision dual-axis rotating test chamber designed for MEMS inertial sensor batch calibration and test. Dual axes support independent or coordinated control, wide rate range, high operational stability, capable of simulating various motion excitation conditions. Compatible with -55℃ to 150℃ high-low temperature environment, meeting full temperature range calibration and test requirements for consumer, industrial, and automotive-grade MEMS devices.
- Application
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MEMS Gyroscope / Accelerometer Sensor
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NHS-410 High-Speed Pick-and-Place Handler
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