Semiconductor Tri-Temp Test Handler System_Semiconductor Test Handler Equipment_nextas-automatic intelligent equipment manufacturer,intelligent testing equipmen

Semiconductor Tri-Temp Test Handler System: This system provides -55℃ to 150℃ wide temperature range FT test and handling for Memory/MCU ICs. Based on the NHS-410 handler platform, paired with MTS320 series tri-temp chamber, featuring dual-carrier shuttle structure and dual-station alternating test mode, supporting up to 512-site parallel test. Proven in volume production at multiple tier-1 OSAT and IDM customers. Temperature range -55℃ to 150℃, accuracy ±0.5℃, up to 512 sites, dual-station alternating test, parallel load/unload and test. Compatible with package sizes from 1×1mm to 12×12mm, supporting LGA/BGA/QFN/SOP/WSON packages. Target applications: Nor Flash, NAND Flash, MCU and other memory and processor IC FT tri-temp test and handling.