- Semiconductor Tri-Temp Test Handler System
This system provides -55℃ to 150℃ wide temperature range FT test and handling for Memory/MCU ICs. Based on the NHS-410 handler platform, paired with MTS320 series tri-temp chamber, featuring dual-carrier shuttle structure and dual-station alternating test mode, supporting up to 512-site parallel test. Proven in volume production at multiple tier-1 OSAT and IDM customers. Temperature range -55℃ to 150℃, accuracy ±0.5℃, up to 512 sites, dual-station alternating test, parallel load/unload and test. Compatible with package sizes from 1×1mm to 12×12mm, supporting LGA/BGA/QFN/SOP/WSON packages. Target applications: Nor Flash, NAND Flash, MCU and other memory and processor IC FT tri-temp test and handling.
- Application
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Storage Chip
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Power Chip
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MCU semiconductor
- Related Products
RHS-430 Test & Tape & Reel Handler
FUNCTION
FEATURE
- UPH > 20,000 @ 0s test time, 240-site parallel test.
- Tape or bulk input, tape or bulk output.
- Overall jam rate < 1/10,000, stable and reliable operation.
- Multi-camera high-speed flying vision with deep learning, high-speed precision image processing.
- Matrix nozzle + turret nozzle.
- Auto laser marking (optional).
- Compatible with various complex test environments.
- Fully compatible with mainstream ATE systems.
- Supports MES and SECS-GEM protocol, seamless smart factory integration.
APPLICATION
Memory IC, MCU, MEMS sensor, power IC, RF front-end IC test and tape & reel packaging.
