- Semiconductor Tri-Temp Test Handler System
This system provides -55℃ to 150℃ wide temperature range FT test and handling for Memory/MCU ICs. Based on the NHS-410 handler platform, paired with MTS320 series tri-temp chamber, featuring dual-carrier shuttle structure and dual-station alternating test mode, supporting up to 512-site parallel test. Proven in volume production at multiple tier-1 OSAT and IDM customers. Temperature range -55℃ to 150℃, accuracy ±0.5℃, up to 512 sites, dual-station alternating test, parallel load/unload and test. Compatible with package sizes from 1×1mm to 12×12mm, supporting LGA/BGA/QFN/SOP/WSON packages. Target applications: Nor Flash, NAND Flash, MCU and other memory and processor IC FT tri-temp test and handling.
- Application
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Storage Chip
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Power Chip
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MCU semiconductor
- Related Products
MTS320A Memory/MCU Tri-Temp Test System
FUNCTION
FEATURE
- Temperature range -55℃ to 150℃.
- Dual-carrier shuttle structure, pre-soak and test operations run in parallel for higher throughput.
- Up to 512-site parallel test.
- Motorized plunger with quick-change design, pneumatic quick-clamp docking with ATE.
- Compatible with BGA, QFP, TSOP, LGA, SOP and other mainstream package types.
APPLICATION
Nor Flash, NAND Flash, MCU FT tri-temp test
